| Title: |
EffiTest: efficient delay test and statistical prediction for configuring post-silicon tunable buffers |
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| Authors: |
Grace Li Zhang |
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Technische Universitat Munchen, Munich, Germany, Institute for Electronic Design Automation
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| Bing Li |
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Technische Universitat Munchen, Munich, Germany, Institute for Electronic Design Automation
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| Ulf Schlichtmann |
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Technische Universitat Munchen, Munich, Germany, Institute for Electronic Design Automation
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| Sharing: |
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| DBLP Key: |
conf/dac/ZhangLS16
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