| Title: |
Relevance vector and feature machine for statistical analog circuit characterization and built-in self-test optimization |
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| Authors: |
Honghuang Lin |
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Texas A&M University, Department of Electrical and Computer Engineering
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| Peng Li |
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Texas A&M University, Department of Electrical and Computer Engineering
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| Sharing: |
Unknown
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| Verification: |
Authors have
not verified
information
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| Artifact Evaluation Badge: |
none
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| NSF Award Numbers: |
1117660
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| DBLP Key: |
conf/dac/LinL16
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| Author Comments: |
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