Design Automation Conference, DAC 2016


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Title: Efficient transistor-level timing yield estimation via line sampling
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Authors: Hiromitsu Awano
  • Kyoto University Yoshida-honmachi, Sakyo, Kyoto, Japan, 606–8501, Graduate School of Informatics
Takashi Sato
  • Kyoto University Yoshida-honmachi, Sakyo, Kyoto, Japan, 606–8501, Graduate School of Informatics
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DBLP Key: conf/dac/AwanoS16
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