| Title: |
Anti-patterns in search-based program repair |
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| Authors: |
Shin Hwei Tan |
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National University of Singapore
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| Hiroaki Yoshida |
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Fujitsu Laboratories of America, Inc.
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| Mukul R. Prasad |
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Fujitsu Laboratories of America, Inc.
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| Abhik Roychoudhury |
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National University of Singapore
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| Sharing: |
Research produced artifacts
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Authors have
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none
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| DBLP Key: |
conf/sigsoft/TanYPR16
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