REMI: defect prediction for efficient API testing

Article Details
Title:	REMI: defect prediction for efficient API testing
Article URLs:	https://doi.org/10.1145/2786805.2804429
Alternative Article URLs:
Authors:	Mijung Kim	The Hong Kong University of Science and Technology, Department of Computer Science and Engineering
	Jaechang Nam	The Hong Kong University of Science and Technology, Department of Computer Science and Engineering
	Jaehyuk Yeon	Software R&D Center
	Soonhwang Choi	Software R&D Center
	Sunghun Kim	The Hong Kong University of Science and Technology, Department of Computer Science and Engineering
Sharing:	Unknown
Verification:	Authors have not verified information
Artifact Evaluation Badge:	none
Artifact URLs:
Artifact Correspondence Email Addresses:
NSF Award Numbers:
DBLP Key:	conf/sigsoft/KimNYCK15
Author Comments:

ACM Foundations of Software Engineering, FSE 2015