ACM Intl. Conf. on Measurement and Modeling of Comp. Sys., SIGMETRICS 2017


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Title: Characterizing and Modeling Patching Practices of Industrial Control Systems
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Authors: Brandon Wang
  • University of Iowa
Xiaoye Li
  • University of Iowa
Leandro Pfleger de Aguiar
  • Siemens Corporation, USA
Daniel Sadoc Menasché
  • Federal University of Rio de Janeiro
Zubair Shafiq
  • University of Iowa
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DBLP Key: conf/sigmetrics/WangLAMS17
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