ACM Intl. Conf. on Measurement and Modeling of Comp. Sys., SIGMETRICS 2016


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Title: Understanding Latency Variation in Modern DRAM Chips: Experimental Characterization, Analysis, and Optimization
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Authors: Kevin K. Chang
  • Carnegie Mellon University
Abhijith Kashyap
  • Carnegie Mellon University
Hasan Hassan
  • Carnegie Mellon University
  • TOBB ETÜ
Saugata Ghose
  • Carnegie Mellon University
Kevin Hsieh
  • Carnegie Mellon University
Donghyuk Lee
  • Carnegie Mellon University
Tianshi Li
  • Carnegie Mellon University
  • Peking University
Gennady Pekhimenko
  • Carnegie Mellon University
Samira Manabi Khan
  • University of Virginia
Onur Mutlu
  • ETH Zurich
  • Carnegie Mellon University
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NSF Award Numbers: 1212962, 1320531
DBLP Key: conf/sigmetrics/ChangKHGHLLPKM16
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