ACM/IEEE Intl. Conf. for High Perf. Computing, Networking, Storage and Analysis, SC 2014


Article Details
Title: Quantitatively Modeling Application Resilience with the Data Vulnerability Factor
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Authors: Li Yu
  • Illinois Institute of Technology
Dong Li
  • Oak Ridge National Laboratory
Sparsh Mittal
  • Oak Ridge National Laboratory
Jeffrey S. Vetter
  • Oak Ridge National Laboratory
  • Georgia Institute of Technology
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DBLP Key: conf/sc/YuLMV14
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