ACM/IEEE Intl. Conf. for High Perf. Computing, Networking, Storage and Analysis, SC 2017


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Title: Failures in large scale systems: long-term measurement, analysis, and implications
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Authors: Saurabh Gupta
  • Intel Labs
Tirthak Patel
  • Northeastern University
Christian Engelmann
  • Oak Ridge National Laboratory
Devesh Tiwari
  • Northeastern University
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DBLP Key: conf/sc/GuptaPET17
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