| Title: |
Local recovery and failure masking for stencil-based applications at extreme scales |
| Article URLs: |
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| Alternative Article URLs: |
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| Authors: |
Marc Gamell |
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Rutgers University, Rutgers Discovery Informatics Institute
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| Keita Teranishi |
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Sandia National Laboratories
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| Michael A. Heroux |
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Sandia National Laboratories
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| Jackson Mayo |
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Sandia National Laboratories
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| Hemanth Kolla |
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Sandia National Laboratories
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| Jacqueline Chen |
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Sandia National Laboratories
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| Manish Parashar |
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Rutgers University, Rutgers Discovery Informatics Institute
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| Sharing: |
Unknown
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| Verification: |
Authors have
not verified
information
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| Artifact Evaluation Badge: |
none
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| Artifact URLs: |
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| Artifact Correspondence Email Addresses: |
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| NSF Award Numbers: |
1339036,
1310283,
1305375,
1228203
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| DBLP Key: |
conf/sc/GamellTHMKCP15
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| Author Comments: |
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