ACM/IEEE Intl. Conf. for High Perf. Computing, Networking, Storage and Analysis, SC 2014


Article Details
Title: Understanding Soft Error Resiliency of Blue Gene/Q Compute Chip through Hardware Proton Irradiation and Software Fault Injection
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Authors: Chen-Yong Cher
  • IBM T. J. Watson Research Center
Meeta Sharma Gupta
  • IBM T. J. Watson Research Center
Pradip Bose
  • IBM T. J. Watson Research Center
K. Paul Muller
  • IBM Systems and Technology Group (STG)
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DBLP Key: conf/sc/CherGBM14
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