ACM Conference on Mobile Systems, Applications, and Services, MobiSys 2016


Article Details
Title: Idea: A System for Efficient Failure Management in Smart IoT Environments
Article URLs:
Alternative Article URLs:
Authors: Palanivel A. Kodeswaran
  • IBM Research
Ravi Kokku
  • IBM Research
Sayandeep Sen
  • IBM Research
Mudhakar Srivatsa
  • IBM Research
Sharing: Unknown
Verification: Authors have not verified information
Artifact Evaluation Badge: none
Artifact URLs:
Artifact Correspondence Email Addresses:
NSF Award Numbers:
DBLP Key: conf/mobisys/KodeswaranKSS16
Author Comments:

Discuss this paper and its artifacts below