ACM Multimedia, MM 2016


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Title: A Robust Distance with Correlated Metric Learning for Multi-Instance Multi-Label Data
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Authors: Yashaswi Verma
  • International Institute of Information Technology, Hyderabad, CVIT
C. V. Jawahar
  • International Institute of Information Technology, Hyderabad, CVIT
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DBLP Key: conf/mm/VermaJ16
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