IEEE/ACM International Symposium on Microarchitecture, MICRO 2016


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Title: Spectral profiling: Observer-effect-free profiling by monitoring EM emanations
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Authors: Nader Sehatbakhsh
  • Georgia Institute of Technology
Alireza Nazari
  • Georgia Institute of Technology
Alenka G. Zajic
  • Georgia Institute of Technology
Milos Prvulovic
  • Georgia Institute of Technology
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NSF Award Numbers: 1563991, 1318934, 1320717
DBLP Key: conf/micro/SehatbakhshNZP16
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