ACM SIGPLAN/SIGBED Intl. Conf. on Langs., Compilers, & Tools for Emb. Sys., LCTES 2017


Article Details
Title: AOT vs. JIT: impact of profile data on code quality
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Authors: April W. Wade
  • University of Kansas
Prasad A. Kulkarni
  • University of Kansas
Michael R. Jantz
  • University of Tennessee
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NSF Award Numbers: 0953268, 1619140, 1617954, 1464288
DBLP Key: conf/lctrts/WadeKJ17
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