| Title: |
Secure and Durable (SEDURA): An Integrated Encryption and Wear-leveling Framework for PCM-based Main Memory |
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| Authors: |
Chen Liu |
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University of Delaware, Dept. of Electrical and Computer Engineering
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| Chengmo Yang |
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University of Delaware, Dept. of Electrical and Computer Engineering
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| Sharing: |
Unknown
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| Verification: |
Authors have
not verified
information
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| Artifact Evaluation Badge: |
none
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| Artifact URLs: |
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| Artifact Correspondence Email Addresses: |
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| NSF Award Numbers: |
1253733
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| DBLP Key: |
conf/lctrts/LiuY15
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| Author Comments: |
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