ACM Knowledge Discovery and Data Mining, KDD 2015


Article Details
Title: Efficient Long-Term Degradation Profiling in Time Series for Complex Physical Systems
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Authors: Liudmila Ulanova
  • UC Riverside
Tan Yan
  • NEC Laboratories America
Haifeng Chen
  • NEC Laboratories America
Guofei Jiang
  • NEC Laboratories America
Eamonn J. Keogh
  • UC Riverside
Kai Zhang
  • NEC Laboratories America
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NSF Award Numbers: 1161997
DBLP Key: conf/kdd/UlanovaYCJKZ15
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