ACM Knowledge Discovery and Data Mining, KDD 2015


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Title: Quick Sensitivity Analysis for Incremental Data Modification and Its Application to Leave-one-out CV in Linear Classification Problems
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Authors: Shota Okumura
  • Nagoya Institute of Technology Nagoya, Japan
Yoshiki Suzuki
  • Nagoya Institute of Technology Nagoya, Japan
Ichiro Takeuchi
  • Nagoya Institute of Technology Nagoya, Japan
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DBLP Key: conf/kdd/OkumuraST15
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