IEEE International Test Conference, ITC 2016


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Title: EMACS: Efficient MBIST architecture for test and characterization of STT-MRAM arrays
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Authors: Insik Yoon
  • Georgia Institute of Technology, School of Electrical & Computer Engineering
Ashwin Chintaluri
  • Georgia Institute of Technology, School of Electrical & Computer Engineering
Arijit Raychowdhury
  • Georgia Institute of Technology, School of Electrical & Computer Engineering
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DBLP Key: conf/itc/YoonCR16
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