IEEE International Test Conference, ITC 2016


Article Details
Title: Cross-layer system reliability assessment framework for hardware faults
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Authors: Alessandro Vallero
  • Politecnico di Torino, Italy
Alessandro Savino
  • Politecnico di Torino
Gianfranco Politano
  • Politecnico di Torino, Italy
Stefano Di Carlo
  • Politecnico di Torino, Italy
Athanasios Chatzidimitriou
  • University of Athens, Greece
Sotiris Tselonis
  • University of Athens, Greece
Manolis Kaliorakis
  • University of Athens, Greece
Dimitris Gizopoulos
  • University of Athens, Greece
Marc Riera
  • Universitat Politècnica de Catalunya
Ramon Canal
  • Universitat Politècnica de Catalunya
Antonio González
  • Universitat Politècnica de Catalunya
Maha Kooli
  • LIRMM, Montpellier
Alberto Bosio
  • LIRMM, Montpellier
Giorgio Di Natale
  • LIRMM, Montpellier
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DBLP Key: conf/itc/ValleroSPCCTKGR16
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