| Article Details | ||
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| Title: | Automated measurement of defect tolerance in mixed-signal ICs | |
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| Authors: | Stephen Sunter |
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| Alessandro Valerio |
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| Riccardo Miglierina |
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| Sharing: | Unknown | |
| Verification: | Authors have not verified information | |
| Artifact Evaluation Badge: | none | |
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| DBLP Key: | conf/itc/SunterVM16 | |
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