IEEE International Test Conference, ITC 2016


Article Details
Title: Mixed-signal ATE technology and its impact on today's electronic system
Article URLs:
Alternative Article URLs:
Authors: Gordon W. Roberts
  • McGill University, Integrated Microsystems Laboratory
Sharing: Unknown
Verification: Author has not verified information
Artifact Evaluation Badge: none
Artifact URLs:
Artifact Correspondence Email Addresses:
NSF Award Numbers:
DBLP Key: conf/itc/Roberts16
Author Comments:

Discuss this paper and its artifacts below