IEEE International Test Conference, ITC 2016


Article Details
Title: Plenary keynote address Tuesday: The business of test: Test and semiconductor economics
Article URLs:
Alternative Article URLs:
Authors: Walden C. Rhines
  • Mentor Graphics
Sharing: Unknown
Verification: Author has not verified information
Artifact Evaluation Badge: none
Artifact URLs:
Artifact Correspondence Email Addresses:
NSF Award Numbers:
DBLP Key: conf/itc/Rhines16
Author Comments:

Discuss this paper and its artifacts below