IEEE International Test Conference, ITC 2016


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Title: Test point insertion in hybrid test compression/LBIST architectures
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Authors: Elham K. Moghaddam
  • Mentor Graphics Corporation
Nilanjan Mukherjee
  • Mentor Graphics Corporation
Janusz Rajski
  • Mentor Graphics Corporation
Jerzy Tyszer
  • Poznań University of Technology
Justyna Zawada
  • Poznań University of Technology
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DBLP Key: conf/itc/MoghaddamMRTZ16
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