| Title: |
Output bit selection methodology for test response compaction |
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| Authors: |
Wei-Cheng Lien |
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National Cheng Kung University, Department of Electrical Engineering
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| Kuen-Jong Lee |
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National Cheng Kung University, Department of Electrical Engineering
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| Sharing: |
Unknown
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| Verification: |
Authors have
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| Artifact Evaluation Badge: |
none
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| DBLP Key: |
conf/itc/LienL16
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