IEEE International Test Conference, ITC 2016


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Title: Handling wrong mapping: A new direction towards better diagnosis with low pin convolution compressors
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Authors: Subhadip Kundu
  • Synopsys India Pvt. Ltd., Bangalore, India
Parthajit Bhattacharya
  • Synopsys India Pvt. Ltd., Bangalore, India
Rohit Kapur
  • Synopsys Inc., Mountain View, CA, USA
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DBLP Key: conf/itc/KunduBK16
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