IEEE International Test Conference, ITC 2016


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Title: Supply-voltage optimization to account for process variations in high-volume manufacturing testing
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Authors: Gurunath Kadam
  • Intel Deutschland GmbH
  • Technical University of Darmstadt, IES Department
Markus Rudack
  • Intel Deutschland GmbH
Krishnendu Chakrabarty
  • Duke University, ECE Department
Juergen Alt
  • Intel Deutschland GmbH
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DBLP Key: conf/itc/KadamRCA16
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