IEEE International Test Conference, ITC 2016


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Title: Advanced test methodology for complex SoCs
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Authors: Pavan Kumar Datla Jagannadha
  • NVIDIA Corp, DFT Engineering
Mahmut Yilmaz
  • NVIDIA Corp, DFT Engineering
Milind Sonawane
  • NVIDIA Corp, DFT Engineering
Sailendra Chadalavada
  • NVIDIA Corp, DFT Engineering
Shantanu Sarangi
  • NVIDIA Corp, DFT Engineering
Bonita Bhaskaran
  • NVIDIA Corp, DFT Engineering
Ayub Abdollahian
  • NVIDIA Corp, DFT Engineering
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DBLP Key: conf/itc/JagannadhaYSCSB16
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