Title: |
A built-in self-repair scheme for DRAMs with spare rows, columns, and bits |
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Authors: |
Chih-Sheng Hou |
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National Central University, Department of Electrical Engineering
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Yong-Xiao Chen |
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National Central University, Department of Electrical Engineering
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Jin-Fu Li |
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National Central University, Department of Electrical Engineering
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Chih-Yen Lo |
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Industrial Technology Research Institute, Information and Communication Research Laboratories
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Ding-Ming Kwai |
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Industrial Technology Research Institute, Information and Communication Research Laboratories
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Yung-Fa Chou |
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Industrial Technology Research Institute, Information and Communication Research Laboratories
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Sharing: |
Unknown
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Verification: |
Authors have
not verified
information
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Artifact Evaluation Badge: |
none
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NSF Award Numbers: |
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DBLP Key: |
conf/itc/HouCLLKC16
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Author Comments: |
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