IEEE International Test Conference, ITC 2016


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Title: A reconfigurable built-in memory self-repair architecture for heterogeneous cores with embedded BIST datapath
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Authors: V. R. Devanathan
  • Texas Instruments Inc., Dallas, TX, USA
Sumant Kale
  • Texas Instruments Inc., Dallas, TX, USA.
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DBLP Key: conf/itc/DevanathanK16
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