IEEE International Test Conference, ITC 2016


Article Details
Title: An accurate algorithm for computing mutation coverage in model checking
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Authors: Huina Chao
  • Chinese Academy of Sciences, SKLCA, Institute of Computing Technology
  • University of Chinese Academy of Sciences
Huawei Li
  • Chinese Academy of Sciences, SKLCA, Institute of Computing Technology
  • University of Chinese Academy of Sciences
Tiancheng Wang
  • Chinese Academy of Sciences, SKLCA, Institute of Computing Technology
  • University of Chinese Academy of Sciences
Xiaowei Li
  • Chinese Academy of Sciences, SKLCA, Institute of Computing Technology
  • University of Chinese Academy of Sciences
Bo Liu
  • Beijing Institute of Control Engineering
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DBLP Key: conf/itc/ChaoLWLL16
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