IEEE International Test Conference, ITC 2016


Article Details
Title: What we know after twelve years developing and deploying test data analytics solutions
Article URLs:
Alternative Article URLs:
Authors: Kenneth M. Butler
  • Texas Instruments, Analog Engineering Operations
Amit Nahar
  • Texas Instruments, Analog Engineering Operations
W. Robert Daasch
  • Portland State University, Dept. of Electrical & Computer Engineering
Sharing: Unknown
Verification: Authors have not verified information
Artifact Evaluation Badge: none
Artifact URLs:
Artifact Correspondence Email Addresses:
NSF Award Numbers:
DBLP Key: conf/itc/ButlerND16
Author Comments:

Discuss this paper and its artifacts below