IEEE International Test Conference, ITC 2016


Article Details
Title: Efficient cross-layer concurrent error detection in nonlinear control systems using mapped predictive check states
Article URLs:
Alternative Article URLs:
Authors: Suvadeep Banerjee
  • Georgia Institute of Technology
Abhijit Chatterjee
  • Georgia Institute of Technology
Jacob A. Abraham
  • University of Texas at Austin
Sharing: Unknown
Verification: Authors have not verified information
Artifact Evaluation Badge: none
Artifact URLs:
Artifact Correspondence Email Addresses:
NSF Award Numbers: 1421353
DBLP Key: conf/itc/BanerjeeCA16
Author Comments:

Discuss this paper and its artifacts below