IEEE International Test Conference, ITC 2016


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Title: SERDES external loopback test using production parametric-test hardware
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Authors: Shalini Arora
  • Intel Corporation, Programmable Solutions Group
Aman Aflaki
  • Intel Corporation, Programmable Solutions Group
Sounil Biswas
  • Intel Corporation, Programmable Solutions Group
Masashi Shimanouchi
  • Intel Corporation, Programmable Solutions Group
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DBLP Key: conf/itc/AroraABS16
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