Known-good-die test methods for large, thin, high-power digital devices

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Title:	Known-good-die test methods for large, thin, high-power digital devices
Article URLs:	https://doi.org/10.1109/TEST.2016.7805851
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Authors:	Dave Armstrong	Advantest, Inc. San Jose, CA, USA
Authors:	Gary Maier	IBM, Inc. East Fishkill, NY, USA
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DBLP Key:	conf/itc/ArmstrongM16
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IEEE International Test Conference, ITC 2016