IEEE International Test Conference, ITC 2016


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Title: Recycled FPGA detection using exhaustive LUT path delay characterization
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Authors: Md Mahbub Alam
  • University of Florida, Department of Electrical and Computer Engineering
Mark Tehranipoor
  • University of Florida, Department of Electrical and Computer Engineering
Domenic Forte
  • University of Florida, Department of Electrical and Computer Engineering
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NSF Award Numbers: 1423282, 1558516
DBLP Key: conf/itc/AlamTF16
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