| Title: |
Harnessing process variations for optimizing wafer-level probe-test flow |
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| Authors: |
Ali Ahmadi |
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The University of Texas at Dallas, Department of Electrical Engineering
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| Constantinos Xanthopoulos |
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The University of Texas at Dallas, Department of Electrical Engineering
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| Amit Nahar |
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Texas Instruments Inc. USA
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| Bob Orr |
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Texas Instruments Inc. USA
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| Michael Pas |
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Texas Instruments Inc. USA
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| Yiorgos Makris |
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The University of Texas at Dallas, Department of Electrical Engineering
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| Sharing: |
Unknown
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| Verification: |
Authors have
not verified
information
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| Artifact Evaluation Badge: |
none
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| DBLP Key: |
conf/itc/AhmadiXNOPM16
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| Author Comments: |
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