ACM SIGSOFT Intl. Symposium on Software Testing and Analysis, ISSTA 2015


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Title: Feedback-controlled random test generation
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Authors: Kohsuke Yatoh
  • University of Tokyo
Kazunori Sakamoto
  • National Institute of Informatics
Fuyuki Ishikawa
  • National Institute of Informatics
Shinichi Honiden
  • University of Tokyo
  • National Institute of Informatics
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DBLP Key: conf/issta/YatohSIH15
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