ACM SIGSOFT Intl. Symposium on Software Testing and Analysis, ISSTA 2017


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Title: ParTeCL: parallel testing using OpenCL
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Authors: Vanya Yaneva
  • University of Edinburgh
Ajitha Rajan
  • University of Edinburgh
Christophe Dubach
  • University of Edinburgh
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DBLP Key: conf/issta/YanevaRD17a
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