| Article Details | ||
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| Title: | Identifying test-suite-overfitted patches through test case generation | |
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| Authors: | Qi Xin |
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| Steven P. Reiss |
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| Sharing: | Unknown | |
| Verification: | Authors have not verified information | |
| Artifact Evaluation Badge: | none | |
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| DBLP Key: | conf/issta/XinR17 | |
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