ACM SIGSOFT Intl. Symposium on Software Testing and Analysis, ISSTA 2017


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Title: FLUCCS: using code and change metrics to improve fault localization
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Authors: Jeongju Sohn
  • Korea Advanced Institute of Science and Technology
Shin Yoo
  • Korea Advanced Institute of Science and Technology
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DBLP Key: conf/issta/SohnY17
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