| Title: |
Pin Defect Inspection with X-ray Images |
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| Authors: |
Hsien-Pei Kao |
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National Taiwan University, Department of Computer Science and Information Engineering
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| Tzu-Chia Tung |
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National Taiwan University, Department of Computer Science and Information Engineerin
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| Hong-Yi Chen |
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National Taiwan University, Department of Computer Science and Information Engineerin
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| Cheng-Shih Wong |
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National Taiwan University, Graduate Institute of Biomedical Electronics and Bioinformatics
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| Chiou-Shann Fuh |
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National Taiwan University, Department of Computer Science and Information Engineering
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National Taiwan University, Graduate Institute of Biomedical Electronics and Bioinformatics
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| Sharing: |
Unknown
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| Verification: |
Authors have
not verified
information
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| Artifact Evaluation Badge: |
none
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| DBLP Key: |
conf/isnn/KaoTCWF17
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| Author Comments: |
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