| Title: |
Rescuing Uncorrectable Fault Patterns in On-Chip Memories through Error Pattern Transformation |
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| Authors: |
Henry Duwe |
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University of Illinois at Urbana-Champaign
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| Xun Jian |
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University of Illinois at Urbana-Champaign
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| Daniel Petrisko |
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University of Illinois at Urbana-Champaign
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| Rakesh Kumar |
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University of Illinois at Urbana-Champaign
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| Sharing: |
Unknown
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| Verification: |
Authors have
not verified
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| Artifact Evaluation Badge: |
none
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| NSF Award Numbers: |
unknown
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| DBLP Key: |
conf/isca/DuweJP016
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| Author Comments: |
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