IEEE Conference on Computer Communications, INFOCOM 2015


Article Details
Title: PLACE: Physical layer cardinality estimation for large-scale RFID systems
Article URLs:
Alternative Article URLs:
Authors: Yuxiao Hou
  • Nanyang Technological University, Singapore, School of Computer Engineering
Jiajue Ou
  • Nanyang Technological University, Singapore, School of Computer Engineering
Yuanqing Zheng
  • The Hong Kong Polytechnic University, Department of Computing
Mo Li
  • Nanyang Technological University, Singapore, School of Computer Engineering
Sharing: Unknown
Verification: Authors have not verified information
Artifact Evaluation Badge: none
Artifact URLs:
Artifact Correspondence Email Addresses:
NSF Award Numbers:
DBLP Key: conf/infocom/HouOZL15
Author Comments:

Discuss this paper and its artifacts below