Coverage-driven test code generation for concurrent classes

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Title:	Coverage-driven test code generation for concurrent classes
Article URLs:	https://doi.org/10.1145/2884781.2884876 http://ieeexplore.ieee.org/document/7886985/
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Authors:	Valerio Terragni	Imperial College London, UK, Department of Computing
Authors:	Shing-Chi Cheung	Imperial College London, UK, Department of Computing
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DBLP Key:	conf/icse/TerragniC16
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ACM/IEEE International Conference on Software Engineering, ICSE 2016