ACM/IEEE International Conference on Software Engineering, ICSE 2016


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Title: How does the degree of variability affect bug finding?
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Authors: Jean Melo
  • IT University of Copenhagen, Denmark
Claus Brabrand
  • IT University of Copenhagen, Denmark
Andrzej Wasowski
  • IT University of Copenhagen, Denmark
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DBLP Key: conf/icse/MeloBW16
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