ACM/IEEE International Conference on Software Engineering, ICSE 2018


Article Details
Title: Efficient sampling of SAT solutions for testing
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Authors: Rafael Dutra
  • University of California, Berkeley, EECS Department
Kevin Laeufer
  • University of California, Berkeley, EECS Department
Jonathan Bachrach
  • University of California, Berkeley, EECS Department
Koushik Sen
  • University of California, Berkeley, EECS Department
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NSF Award Numbers: 1409872, 1423645
DBLP Key: conf/icse/DutraLBS18
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