| Title: |
Efficient statistical analysis for correlated rare failure events via asymptotic probability approximation |
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| Authors: |
Handi Yu |
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Fudan University, ASIC and System State Key Lab
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Fudan University, Department of Microelectronics
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| Jun Tao |
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Fudan University, ASIC and System State Key Lab
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Fudan University, Department of Microelectronics
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| Changhai Liao |
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Fudan University, ASIC and System State Key Lab
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Fudan University, Department of Microelectronics
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| Yangfeng Su |
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Fudan University, School of Mathematical Sciences
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| Dian Zhou |
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Fudan University, ASIC and System State Key Lab
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Fudan University, Department of Microelectronics
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University of Texas at Dallas, Dept. of EE
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| Xuan Zeng |
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Fudan University, ASIC and System State Key Lab
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Fudan University, Department of Microelectronics
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| Xin Li |
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Carnegie Mellon University, Dept. of ECE
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| Sharing: |
Unknown
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| Verification: |
Authors have
not verified
information
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| Artifact Evaluation Badge: |
none
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| Artifact URLs: |
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| Artifact Correspondence Email Addresses: |
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| NSF Award Numbers: |
1115556,
1148778
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| DBLP Key: |
conf/iccad/YuTLSZZ016
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| Author Comments: |
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