| Article Details | ||
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| Title: | The hype, myths, and realities of testing 3D integrated circuits | |
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| Authors: | Ran Wang |
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| Sergej Deutsch |
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| Mukesh Agrawal |
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| Krishnendu Chakrabarty |
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| Sharing: | Unknown | |
| Verification: | Authors have not verified information | |
| Artifact Evaluation Badge: | none | |
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| DBLP Key: | conf/iccad/WangDAC16 | |
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