| Title: |
Fast physics-based electromigration checking for on-die power grids |
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| Authors: |
Sandeep Chatterjee |
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University of Toronto, ECE Department
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| Valeriy Sukharev |
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Mentor Graphics Corporation
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| Farid N. Najm |
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University of Toronto, ECE Department
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| Sharing: |
Unknown
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| Verification: |
Authors have
not verified
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none
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| DBLP Key: |
conf/iccad/ChatterjeeSN16
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| Author Comments: |
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